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ANALYTICAL ELECTRON MICROSCOPY OF DILUTED CU-CO ALLOYS
Buršík, Jiří ; Svoboda, Milan
The work is focused on characterization of diluted model Cu-Co alloys with Co content from 2 to 4 wt.% after various thermal treatment. After initial annealing at 1273 K followed by water cooling, further annealing of the oversaturated solid solution in the range 773 to 1073 K generated a fine distribution of Co-rich precipitates. Parameters of microstructure were characterized by means of transmission electron microscopy with energy dispersive X-ray analysis.
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Characterization of Ta-B-C nanostructured hard coatings
Buršík, Jiří ; Buršíková, V. ; Souček, P. ; Zábranský, L. ; Vašina, P.
Microstructure and mechanical properties of Ta-B-C nanocrystalline layers prepared by magnetron sputtering were studied. DC magnetron sputtering was used to prepare thin layers on rotated substrates. Various deposition parameters were tested. Microstructure of layers was studied by means of scanning and transmission electron microscopy on thin lamellar cross sections prepared using a focussed ion beam. Both undisturbed layers and the volume under relatively large indentation prints (load of 1 N) were observed. The microstructure observations were correlated with mechanical properties characterized by means of nanoindentation experiments in both the static and the dynamic loading regime. Elastic modulus, indentation hardness and fracture resistance of prepared nanostructured coatings were evaluated and discussed.
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ANALYTICAL ELECTRON MICROSCOPY OF DILUTED CU–CO ALLOYS
Buršík, Jiří ; Svoboda, Milan
The work is focused on characterization of diluted model Cu–Co alloys with Co content from 2 to 4 wt.% after various thermal treatment. After initial annealing at 1273 K followed by water cooling, further annealing of the oversaturated solid solution in the range 773 to 1073 K generated a fine distribution of Co-rich precipitates. Parameters of microstructure were characterized by means of transmission electron microscopy with energy dispersive X-ray analysis.
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